Skip to main content

What is TESTMETRIX®?

A significant portion of development time goes into root cause analysis. As a rule, the more dependencies exist within the overall system, the more complex the error analysis becomes.

TESTMETRIX® is a platform that simplifies root cause analysis specifically for embedded test runs by consolidating relevant test artifacts and maximizing traceability.



Current State of the Embedded Testing World

Embedded systems consist of various software and hardware subsystems. These various dependencies frequently cause errors that are not immediately apparent.

To find bugs early, embedded software developers often rely on additionally self-developed test systems tailored precisely to the respective embedded system. Furthermore, Hardware-in-the-Loop test systems are increasingly being developed to continuously and automatically test the embedded software on real hardware during development.

This creates an additional dependency between the embedded system and its associated test system. This test system is itself its own software project and often also its own embedded project.



Challenge in Error Analysis

These developments allow bugs to be found earlier; however, root cause analysis remains tedious.

Test data is often scattered.

on the Device under Test (DuT)
on the test system
within the CI/CD pipeline
additional sources
frequently in the backend


Role of TESTMETRIX®

By integrating TESTMETRIX®, all these various test data sources are consolidated and visualized in context.
This significantly simplifies root cause analysis.

Device under Test (DuT)
Test System
CI/CD Pipeline
Backend
Additional Sources
TESTMETRIX®
Consolidated & Visualized


How does TESTMETRIX® work?


1
Run tests
2
Upload test reports and artifacts via REST API
3
Test data and test cases are visualized in context
4
Ergebnis
Accelerated root cause analysis


Additional Benefits at a Glance


Complete traceability of software & hardware versions between DuT and test system
Easy CI/CD integration via REST API
Dedicated management for Hardware-in-the-Loop test benches (HiL)
Visualization of physical & digital metrics
Improve stability of HiL systems
Accelerate scaling from DuT (Device under Test) to SuT (System under Test)


FAQs



Was this page helpful?